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VLSI Testing IEEE Projects 2018 – 19 for MTech Students

VLSI Testing IEEE Projects for Masters degree, BE, BTech, ME, MTech final Year Academic Submission. VLSI Testing Thesis for PhD and Research Students. Download complete VLSI Testing Project Code with Full Report, PDF, PPT, Tutorial, Documentation, VLSI Testing Research paper and Thesis Work.

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Latest 2018-2019 VLSI Testing Project topics for M.Tech Students:

S.NOPROJECT TITLEYEAR   
V17TEST01COMEDI: Combinatorial Election of Diagnostic Vectors From Detection Test Sets for Logic Circuits2017
V17TEST02Low-Power Scan-Based Built-In Self-Test Based on Weighted Pseudorandom Test Pattern Generation and Reseeding2017
V17TEST03Scalable Approach for Power Droop Reduction During Scan-Based Logic BIST2017
V17TEST04Hardware-Efficient Built-In Redundancy Analysis for Memory With Various Spares2017
V17TEST05High-Speed Parallel LFSR Architectures Based on Improved State-Space Transformations2017
V17TEST06An Improved DCM-based Tunable True Random Number Generator for Xilinx FPGA2017
V17TEST07LFSR-Based Generation of Multi cycle Tests2017
S.NOPROJECT TITLEYEAR   
V16TEST01Enhanced Built-In Self-Repair Techniques for Improving Fabrication Yield and Reliability of Embedded Memories2016
V16TEST02A Test Selection Procedure for Improving the Accuracy of Defect Diagnosis2016
V16TEST03Low-Cost and High-Reduction Approaches for Power Droop During Launch-On-Shift Scan-Based Logic BIST2016
V16TEST04Design for Testability of Sleep Convention Logic2016
V16TEST05Computing Seeds for LFSR-Based Test Generation From Non test Cubes2016
S.NOPROJECT TITLEYEAR   
V15TEST01A novel realization of reversible LFSR for its application in cryptography2015
V15TEST02Preemptive Built-In Self-Test for In-Field Structural Testing2015
V15TEST03Scan Chain Masking for Diagnosis of Multiple Chain Failures in a Space Compaction Environment2015
V15TEST04Scan Test Bandwidth Management for Ultralarge-Scale System-on-Chip Architectures2015
V15TEST05Multiplexer based High Throughput S-box for AES Application2015
V15TEST06Skewed-Load Test Cubes Based on Functional Broadside Tests for a Low-Power Test Set2015
V15TEST07A Method of One-Pass Seed Generation for LFSR-Based Deterministic/Pseudo-Random Testing of Static Faults2015
V15TEST08Built-in Self-Calibration and Digital-Trim Technique for 14-Bit SAR ADCs Achieving ±1 LSB INL2015